Skip to main content

James W. Sewall

 

Archive: October 2014

Sewall hires Connie Li Krampf as certified photogrammetrist/analyst. Ms. Krampf brings 29 years’ experience in all phases of photogrammetry

    Sewall is pleased to announce the hire of Connie Li Krampf, CP, CMS, MSCS, as Certified Photogrammetrist/Analyst. Ms. Krampf will complement and strengthen Sewall’s imaging and mapping capabilities.   Ms. Krampf brings 29 years’ experience in all phases of photogrammetry as a Certified Photogrammetrist (CP) and Certified Mapping Scientist (CMS) in GIS/LIS.  Previous experience includes serving as Certified Photogrammetrist/GIS Specialist at AECOM in...

 

Powered by Sewall